<內容簡介>

The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the significant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples.

The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability.

Features

  COSMOS is available with this title -- Complete Online Solutions Manual Organization System. Instructors can learn more about the system by clicking here. and register for the system at the following link http://cosmos.mhhe.com.

  To purchase an eBook version of this title visit www.coursesmart.com (ISBN 0077436504). With the CourseSmart e Textbook version of this title, students can save money, reduce their impact on the environment, and access powerful web tools for learning. Faculty can also review and compare the full text online without having to wait for a print desk copy.

<章節目錄>

1 Introduction
2 Fabrication of MOSFETS
3 MOS Transistor
4 Modeling of MOS Transistors Using SPICE
5 MOS Inverters: Static Characteristics
6 MOS Inverters: Switching Characteristics and Interconnect Effects
7 Combinational MOS Logic Circuits
8 Sequential MOS Logic Circuits
9 Dynamic Logic Circuits
10 Semiconductor Memories
11 Low-Power CMOS Logic Circuits
12 Arithmetic Building Blocks
13 Clock (I/O) Circuits
14 Design for Manufacturability
15 Design for Testability