This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.
On-wafer Microwave Measurements and De-embedding
- 作者： Errikos Lourandakis
- 出版社： Artech House
- 出版日期： 2016-07-31
- ISBN碼： 9781630810566
- 編號： 9781630810566
$ 5,849 元
原價 6,157
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$5,849